Invited talks
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Edward S. Bielejec, Sandia National Laboratories, Albuquerque, USA,
Fabrication of Single Atom Devices by Direct Write Nanofabrication -
Ivana Capan, Ruđer Bošković Institute, Laboratory for Semiconductors, Zagreb, Croatia,
What can we learn about radiation induced defect centers with capacitance transient techniques: energy level diagrams, thermal stability, introduction rates and more -
David Cox, Advanced Technologies Institute, University of Surrey, Guildford, UK
Deterministic implantation using FIB: The battle with statistics -
Georgy Astakhov, Institute of Ion Beam Physics and Materials Research, HZDR, Germany
Effect of irradiation on defect coherence properties in silicon carbide -
Gregor Hlawacek, Institute of Ion Beam Physics and Materials Research, HZDR, Germany
In-situ experiments and characterization in the Helium Ion Microscope -
Guanghua Du, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, China,
Nano structure fabrication using single heavy ions of MeV/amu energy range, techniques and applications -
Jacopo Forneris, Università degli Studi di Torino, Solid State Physics Group, Torino, Italy,
Fabrication of color centers in diamond by ion implantation for single-photon sources engineering and quantum sensing applications -
Jan Meijer, Universität Leipzig, Felix Bloch Institute for Solid State Physics, Leipzig, Germany
Deterministic single ion implantation: A door opener for quantum technology products -
Jérôme Tribollet, Institut de Chimie, Université de Strasbourg, France
SiC-YiG quantum sensor for surface EPR at X band: concept and first experimental developments -
Juha Muhonen, Department of Physics, Nanoscience Center, University of Jyväskylä, Finland
Silicon quantum technologies using spins of implanted donor atoms - Ben Murdin, Photonics and Quantum Sciences Group, Department of Physics, University of Surrey, Guildford, UK
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Takeshi Ohshima, Quantum Beam Science Research Directorate, Takasaki Advanced Radiation Research Institute, Takasaki, Japan
Creation of silicon vacancy in silicon carbide using proton beam writing techniques for quantum sensing -
Michal Pomorski, CEA-LIST, Diamond Sensors Laboratory, Gif-sur-Yvette, France
Development and applications of diamond membrane detectors -
Ferdinand Schmidt-Kaler, Johannes Gutenberg-Universität Mainz, Institut für Physik, Mainz, Germany
A linear Paul trap for catching, sympathetic cooling, identifying and shooting out ions: Deterministic doping solids for quantum information processing and simulation -
Zdravko Siketić, Ruđer Bošković Institute, Laboratory for ion beam interactions, Zagreb, Croatia
Capabilities of microanalysis using single MeV ions
Technical reports*
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Cheng-Wei Lee, Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, USA
Hot-electron enhancement of oxygen diffusion in MgO under proton irradiation from first principles -
Frederico Picolo, Università degli Studi di Torino, Solid State Physics Group, Torino, Italy
Ion beam modification of diamond for biosensing application: from nanoparticle sensing and drug delivery to bulk electrochemical sensors -
Jacques O’Connell, Nelson Mandela University, Port Elizabeth, South Africa
TEM characterization of SHI based material modification -
Marko Karlušić, Ruđer Bošković Institute, Laboratory for semiconductors, Zagreb, Croatia
Swift heavy ion irradiated effects in graphene and gallium nitride -
Mateus Masteghin, Department of Physics, University of Surrey, Guildford, UK
Liquid Metal Alloy sources for Quantum Applications -
Marco Peres, Instituto Superior Técnico, Universidade de Lisboa, Portugal
In Situ Characterization and Modification of β-Ga2O3 Flakes Using an Ion Micro-Probe -
Nathan Cassidy, Department of Physics, University of Surrey, Guildford, UK
Single Ion Detection Counting Statistics - towards 99% detection -
Natko Skukan, Ruđer Bošković Institute, Laboratory for ion beam interactions, Zagreb, Croatia
Charge multiplication in diamond - Paul Räcke, Leibniz Institute of Surface Engineering (IOM), Leipzig, Germany, Image charge detection statistics relevant for deterministic ion implantation
* Additional contributions are welcome; please contact one of the Workshop chairs with your suggestions (milko.jaksic@irb.hr or ettore.vittone@unito.it)